Resonant Magnetic X-ray Scattering from in Situ Grown Holmium-metal Films

نویسندگان

  • C. Schüßler-Langeheine
  • E. Weschke
  • R. Meier
  • A.Yu. Grigoriev
  • H. Ott
  • Chandan Mazumdar
  • D. V. Vyalikh
  • C. Sutter
  • D. Abernathy
  • G. Grübel
  • G. Kaindl
چکیده

Resonant magnetic X-ray scattering (RMXS) experiments at the Ho-L3 and M5 thresholds have been performed on thin holmium-metal films grown in situ in ultra-high vacuum on W(110). The experimental set-up for these experiments as well as results for the magnetic structure of these films will be described. The magnetic structure stays bulk-like down to a thickness of 14 monolayers.

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تاریخ انتشار 2004